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Title : Event-Log-Based Failure Prediction and Monitoring For After-Sales Engineering Systems
Date : May 31, 2008
Speaker : Shiyu Zhou, Associate Professor
Affiliation : Department of Industrial and Systems Engineering, University of Wisconsin - Madison
Abstract
With the rapid development of information technology, an abundance of data that record the events occurred in a system are now collected automatically when the system is in use. It is generally believed that the event logs provide rich information regarding the system working conditions and could be used for condition monitoring, diagnosis, and optimal maintenance. This talk will present the research works in: (1) System survival model fitting using event logs to quantify the associations between system events and the key failure. The survival model encodes the system events as covariates and can be used to rigorously predict the failure probability based on the event logs. And (2) Generic discrete events sequence monitoring , which is based on hypothesis testing in survival analysis to test if the survival model fitted from historical data can fully represent the present system characteristics. The research results provide a quantitative foundation for optimal maintenance service of after-sales equipment.
Biosketch
Stanley B. Gershwin is a Senior Research Scientist at the MIT Department of Mechanical Engineering. He is affiliated with MIT's Laboratory for Manufacturing and Productivity, Leaders for Manufacturing Program, and Operations Research Center.
Dr. Shiyu Zhou is an associate professor in the Department of Industrial and Systems Engineering at the University of Wisconsin-Madison. He got his B.S. and M.S. in Mechanical Engineering at University of Science and Technology of China in 1993 and 1996 respectively, and got his Master in Industrial Engineering and Ph.D. in Mechanical Engineering at the University of Michigan in 2000. Dr. Zhou's research focuses on the fault management of complex engineering systems by integrating statistics, system and control theory, and engineering knowledge. His research is sponsored by National Science Foundation, Department of Energy, NIST-ATP, and industries. He is a recipient of the CAREER Award from the National Science Foundation and the best application paper award from IIE Transactions in 2006. Dr. Zhou is a member of IIE, INFORMS, ASME, and SME.
